The authors show that using the half-wave strip method to deduce the bright and dark fringe conditions of Fraunhofer grating diffraction is simpler than the amplitude vector method.
本文用半波带法对夫琅禾费光栅衍射进行分析该方法和常用的振幅矢量法相比，分析衍射条纹的位置更要快捷，明了。
On the basis of Fraunhofer diffraction theory, the diffraction patterns of a Varied Line-space (VLS) grating were obtained for incidence beam in parallel and uniform.
基于夫琅禾费衍射理论，推导了平行光入射变栅距光栅后衍射光强的角度分布。
On the basis of Fraunhofer diffraction theory, the diffraction patterns of a Varied Line-space (VLS) grating were obtained for incidence beam in parallel and uniform.
基于夫琅禾费衍射理论，推导了平行光入射变栅距光栅后衍射光强的角度分布。
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