A measurement of resistivity of metal film using four-point probe technique can be used as the general physics experiment.
四探针测量金属薄膜电阻率是当今微电子技术领域中常用的方法。
A measurement of resistivity of metal film using four-point probe technique can be used as the general physics experiment.
四探针测量金属薄膜电阻率是当今微电子技术领域中常用的方法。
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