The present situation of Near field Optical Microscopy (NFOM) is introduced.
介绍了纳米分辨近场光学显微成象技术现状。
Scanning near-field optical microscopy (SNOM) is a novel tool for the research down to nanometer scale.
扫描近场光学显微镜(SNOM)是一种能探测纳米尺寸的新型显微工具。
This article describes the technique of Scanning Near-field Optical Microscopy and reviews the recent progress in the application of biology.
本文对SNOM的技术方法及其近期的的生物学应用进行了介绍。
The theory of Near Field Optical Microscopy (NFOM) is reviewed. A real system is presented with which the fish scale sample is imaged and analyzed.
对NFOM的原理进行了论述，并在一个实验的NFOM系统上对鱼鳞片样品进行了成像和分析。
Near-field optical microscopy, based on scanning sample surfaces by the tip of optical probe, obtained the imagined information about the object surface.
近场光学显微镜是利用探针的扫描来获得样品表面信息的。
However, resolution of a traditional wide-field optical microscopy is limited to about 230 nm laterally and 1000 nm axially, due to the diffraction-limit of light.
但由于衍射极限的存在，使传统的宽场光学显微镜横向和纵向的分辨率分别仅约为230nm和1000 nm。
A simple dynamic chemical etching device based on siphon principle is developed for fabrication of optical fiber probes which are commonly used in near-field optical microscopy.
基于虹吸原理，设计了一种动态化学腐蚀法的简易装置，用于制备近场光学显微镜光纤探针。
The essential principle and system structure were compared in common optical microscopy and near field optical microscopy. It is introduced that methods of the fabrication of optical fiber probes.
分析了传统光学显微镜与近场光学显微镜成像原理的物理本质和两种显微镜系统结构的异同点。
Near Field Optical Microscope (NFOM) is a kind of scanning probe microscopy with high resolution.
近场光显微镜(NFOM)是一种高分辩率的扫描探针显微镜。
The effect of electric field on the recrystallization and recrystallization texture development in cold-rolled copper was studied by X-ray diffraction (ODF analysis) combined with optical microscopy.
利用X射线衍射技术并结合金相组织观察和显微硬度实验，研究了冷轧工业纯钢在电场作用下的再结晶及织构演变规律。
In this paper, the new field of electron microscopy: micro-zone properties of so-lid state such as the optical, electric, magnetic, acoustic property and the deep energy level were shown.
本文介绍了电子显微术中一些较新的固体微区特性研究方法及其在半导体物理等固体物理分支学科中的应用。
In this paper, the new field of electron microscopy: micro-zone properties of so-lid state such as the optical, electric, magnetic, acoustic property and the deep energy level were shown.
本文介绍了电子显微术中一些较新的固体微区特性研究方法及其在半导体物理等固体物理分支学科中的应用。
应用推荐