With the aid in test methods and so on XRD, SEM, Research nanometer zinc oxide thin film preparation condition, field emission performance and stability.
借助于XRD、SEM等测试手段，对锥状纳米氧化锌薄膜的制备条件、场发射特性和稳定性分析研究。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
The obtained products were characterized by powder X-ray diffraction (XRD), scanning electron microscopy (SEM), and field-emission scanning electron microscopy (FE-SEM).
利用粉末X射线衍射（XRD）、扫描电镜（SEM）和场发射扫描电镜（FE-SEM）对所得产物进行表征。
The samples were characterized by field-emission scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy(EDS) and photoluminescence (PL).
通过扫描电子显微镜（SEM）、能谱分析仪（EDS）和光致发光（PL）测试对样品进行了表征。
The samples were characterized by field-emission scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy(EDS) and photoluminescence (PL).
通过扫描电子显微镜（SEM）、能谱分析仪（EDS）和光致发光（PL）测试对样品进行了表征。
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