• In this way, the invention solves the problems that the existing method cannot minimize the testing cost and the generated fault locating tree t relatively at the same time.

    这样便解决现有方法无法兼顾使测试代价相对最少使生成故障定位相对最小的问题

    youdao

  • In this way, the invention solves the problems that the existing method cannot minimize the testing cost and the generated fault locating tree t relatively at the same time.

    这样便解决现有方法无法兼顾使测试代价相对最少使生成故障定位相对最小的问题

    youdao

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