The experiments demonstrated that the possibility of pin failure propagation due to a block-age in the channel could be excluded.
试验表明，由于堆芯流道堵塞而引起元件损坏事故蔓延的可能性可以排除。
The experiments demonstrated that the possibility of pin failure propagation due to a block-age in the channel could be excluded.
试验表明，由于堆芯流道堵塞而引起元件损坏事故蔓延的可能性可以排除。
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