Reflection High Energy Electron Diffraction (RHEED);
反射式高能电子衍射；
Simulation and detailed analysis of low energy electron diffraction( LEED) data.
低能量电子绕射（EED）果之模拟及详尽数据分析。
The growth process of the films was in situ monitored by reflective high energy electron diffraction(RHEED).
通过反射高能电子衍射 （RHEED）仪原位实时监测薄膜生长 ，研究薄膜的生长过程。
The growth process of the films was in situ monitored by reflective high energy electron diffraction (RHEED).
通过反射高能电子衍射(RHEED)仪原位实时监测薄膜生长，研究薄膜的生长过程。
Surface damage caused by cutting on Si, InSb, HgCdTe has been studied by Reflection High Energy Electron Diffraction (RHEED) after step-etching the samples.
利用高能反射电子衍射技术（RHEED），研究了硅、锑化铟、碲镉汞样品逐次化学腐蚀后的切割表面损伤。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
The hydration properties of limestone powder in a complex binder system were studied by using scanning electron microscopy, X-ray diffraction and energy dispersive spectrometer.
用扫描电镜、X射线衍射和能谱技术研究石灰石粉在复合胶凝材料中的水化性能和水化产物。
The microstructure, morphology and components of the oxide film are characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy disperse spectroscopy (EDS).
采用扫描电子显微镜(sem)、能谱仪(EDS)、X射线衍射仪(XRD)等仪器研究了氧化膜的形貌、组成和相结构。
The prepared powders and the green and sintered hollow-fiber membranes were characterized by thermal analysis, X-ray diffraction, scanning electron microscopy and X-ray energy dispersive spectroscopy.
用热分析、X射线衍射仪、扫描电镜、X射线能谱等技术对制备的粉体、烧结前后的中空纤维膜进行了表征。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
Using X-ray diffraction, energy spectrum analysis and scanning electron microscope, TiO2 crystallite, shape and size on ceramic surface are tested.
利用x射线衍射仪、能谱分析和电子扫描电镜对瓷砖釉面表面的二氧化钛晶型、形貌、颗粒大小进行了测试。
Using X-ray diffraction, energy spectrum analysis and scanning electron microscope, TiO2 crystallite, shape and size on ceramic surface are tested.
利用x射线衍射仪、能谱分析和电子扫描电镜对瓷砖釉面表面的二氧化钛晶型、形貌、颗粒大小进行了测试。
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