The program includes use of X-ray diffraction, electron microscopy, and other techniques for testing materials on the molecular level.
其中还涉及X射线衍射、电子显微镜及其他仪器的使用，以检测材料的分子结构。
"High resolution electron microscopy for materials science". D. Shindo, K. Hiraga. Springer. 1998. Beautiful collection of HREM images and examples of their analysis.
有中文版，《材料评价的高分辨电子显微学方法》，大量精彩的高分辨照片，使用技巧。
The morphologies of structural changes in the two inorganic silicon materials have been investigated by means of charge coupled device (CCD) camera and scanning electron microscopy (SEM).
对这两种无机硅材料在飞秒脉冲作用后的微区结构改变进行了扫描电子显微镜（SEM）测试，研究了其形貌特征。
ABSTRACT: Cracks on the disc spring parts and raw materials, using metallographic examination, chemical analysis, hardness testing, scanning electron microscopy by means of a comprehensive analysis.
摘要：对碟形弹簧裂纹件和原材料，采用金相检验、化学分析、硬度试验、扫描电镜等手段进行综合分析。
ABSTRACT: Cracks on the disc spring parts and raw materials, using metallographic examination, chemical analysis, hardness testing, scanning electron microscopy by means of a comprehensive analysis.
摘要：对碟形弹簧裂纹件和原材料，采用金相检验、化学分析、硬度试验、扫描电镜等手段进行综合分析。
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