Two main methods, accelerated lifetime test and drift velocity test, to study electromigration are described.

介绍了研究集成电路互连线电迁移的两种方法：加速寿命试验和移动速度试验。

youdao

Two main methods, accelerated lifetime test and drift velocity test, to study electromigration are described.

介绍了研究集成电路互连线电迁移的两种方法：加速寿命试验和移动速度试验。

youdao