• In other applications, it may be necessary to reduce the signal power to the DUT.

    在其它应用中,可能需要减小传输到DUT的信号功率。

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  • DUT is placed in test fixture such as diode, transistors, microstrip circuit and so on.

    被测件放在测试夹具里,如二极管、晶体管、微带电路等。

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  • Examples of the invention can relate to an apparatus for testing a device under test (DUT).

    本发明的例子涉及用于测试待测器件(DUT)的装置。

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  • Vehicle Energy Conservation Institute in Energy Sources Academe at DUT is authorized by DUT in 2006.

    “大连理工大学能源研究院汽车节能研究所”于2006年由大连理工大学批准成立。

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  • The "network" mode USES standard WLAN signaling, which can be used to test the DUT transmitter and receiver.

    “网络”模式采用标准WLAN信令,可用于测试dut的发射器和接收器。

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  • For writing testbenches it is important to have the design specification of "design under test" or simply DUT.

    在写测试基准程序时,认真阅读待测设计或者待测设备的设计说明书是非常重要的。

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  • Shielding the test leads and the DUT (Figure 3-6) will often reduce interference effects to an acceptable level.

    对测试引线和DUT进行屏蔽(图3 - 6)常常能够将这种干扰的影响降低到可以接受的水平。

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  • The sensitive input is surrounded by a guard, which can be carried right up to the DUT for fully guarded measurements.

    由保护电路包围的灵敏的输入电路,可以直接连到DUT上以进行完全保护的测量。

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  • Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).

    通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚,可以进一步减少处理时间。

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  • Here, an electrometer ohmmeter is forcing a current (IR) through the unknown resistance (RS) and then measuring the voltage (VM) across the DUT.

    静电计欧姆计的电流激励(IR)流过未知电阻(RS),然后测量dut上的电压(VM)。

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  • Up to March of 2017, DUT has signed collaborative agreements and memorandums with 204 universities, research institutes, and enterprises in 29 countries and regions.

    截至2017年3月,我校共与29个国家和地区的204所高校、研究机构、大型企业及国际联盟签署了校际合作协议书/备忘录。

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  • The switching solution should have as a minimum the bandwidth of the DUT, and preferably equal to the bandwidth of any higher frequency source and measurement equipment.

    切换方案的最小带宽应该为DUT的带宽,最好是等于任何高频源和测量设备的带宽。

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  • The source resistance of the DUT will affect the noise performance of a feedback ammeter. As the source resistance is reduced, the noise gain of the ammeter will increase.

    DUT的源电阻会影响反馈安培计的噪声性能。源电阻降低,安培计的噪声增益就增加。

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  • Even though the device (DUT) is rapidly varying from standby mode (low current) to the RF transmit state (high current), they are also capable of providing stable voltage output.

    即使待测器件(DUT)从待机状态(低电流)到射频发射状态(高电流)进行快速跳变,它们也能够提供稳定的电压输出。

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  • In these cases, filters can be added to the switch to modify the signal frequency bandwidth, or spurious signals at unwanted fre quencies can be eliminated from the signal to the DUT.

    在这些情况下,可向开关加入滤波器来改变信号的频率带宽,或者从发射到DUT的信号中消除有害频率的杂散信号。

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  • Meanwhile, the clamp circuit will limit the output voltage or current at a fixed value when they are abnormal that caused by a DUT short circuit or other fault in order to protect the device.

    当被测dut发生短路或其他异常导致电流或电压过高时,钳位电路会将输出电压或电流限制在一个固定值上,以保护器件不被损坏。

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  • In order to improve on the properties of drilling pipe and its competitive price, a research on design and manufacturing high strength pipe is done based on a cooperation between DUT and Bao Steel.

    为提高国产钻杆的市场竞争力,改善其使用性能,我们与宝钢合作,开展了《高强度钻杆的开发》这一国家级课题。

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  • In order to improve on the properties of drilling pipe and its competitive price, a research on design and manufacturing high strength pipe is done based on a cooperation between DUT and Bao Steel.

    为提高国产钻杆的市场竞争力,改善其使用性能,我们与宝钢合作,开展了《高强度钻杆的开发》这一国家级课题。

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