At the same instant, Q3 sources current into R4 through D1, thereby pulling the voltage on R4 to a diode drop below the supply voltage.
与此同时，Q3的源电流通过D1流到R4，从而拉动R4的电压，使二极管电压降到低于电源。
To avoid imprecise voltage control due to varying diode drop, the sample is taken from the battery side, even if this means a very small power waste.
以避免由于不同的二极管的压降的不精确电压控制，样品取自在电池的一侧，即使这意味着一个非常小的电力浪费。
The Source-Measure Unit can also test other diode parameters, including forward voltage drop and breakdown voltage.
源-测量单元还可以测量其它的二极管参数，包括正向电压降和击穿电压。
Measure the reverse breakdown voltage by sourcing a specified re verse current bias, then measuring the voltage drop across the diode.
通过施加规定的反向偏流，然后测量二极管两端的电压，即可测得反向偏置电流。
In order to observe the phenomenon of the filament temperature drop caused by the board-current, the ideal diode filament temperature was detected precisely with an infrared thermometer.
为了观察由板流引起的灯丝温度下降现象，利用红外测温仪对理想二极管灯丝温度作了精密测量。
In this circuit, some measures are adopted, such as making constant current source as a rectifying load. It makes the voltage drop of the rectifying diode maintain a constance.
该电路采取以恒流源为整流负载等有关措施，使整流二极管的正向导通压降为一常数。
The VF test is performed by sourcing a known current and measuring the resulting voltage drop across the diode.
VF测试需要提供一个已知的电流然后测量二极管上产生的电压降。
The VF test is performed by sourcing a known current and measuring the resulting voltage drop across the diode.
VF测试需要提供一个已知的电流然后测量二极管上产生的电压降。
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