The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
The program includes use of X-ray diffraction, electron microscopy, and other techniques for testing materials on the molecular level.
其中还涉及X射线衍射、电子显微镜及其他仪器的使用，以检测材料的分子结构。
The resultant surfaces were characterized by means of SEM, transmission electron microscopy (TEM), X-ray diffraction (XRD), and water contact Angle measurements.
用扫描电镜、透射电镜、X射线衍射、接触角测量等技术对表面进行了表征。
The changes of transmission electron diffraction patterns indicate the phase change has occurred at about 220k, and its crystal parameters change obviously.
透射电子衍射花样的变化表明在220k附近发生了相变，它的晶体结构参数明显地变化。
The structure of Li Ca complex grease was studied through IR spectroscopy, X ray diffraction, DTA and electron microscope.
利用红外、X射线衍射、差热和电子显微镜等手段研究了复合锂钙基脂的结构。
Using the TEM to observe the micro shape of coiled carbon whiskers, and analyze their structure by electron diffraction, it can be informed that its structure is hexagonal crystal.
用透射电镜(TEM)观察螺旋形碳晶须的微观形貌，并作选区电子衍射，分析其结构，可知螺旋形碳晶须的结构为六方晶体。
The growth process of the films was in situ monitored by reflective high energy electron diffraction (RHEED).
通过反射高能电子衍射(RHEED)仪原位实时监测薄膜生长，研究薄膜的生长过程。
This paper describes two microcomputer programs of electron diffraction spot patterns.
本文介绍了两种电子衍射花样的微型机分析程序。
The morphology and crystal structure of solvent induced crystalline PET were studied by X-ray diffraction and scanning electron microscope.
应用X射线衍射和扫描电子显微镜研究了溶剂诱导结晶PET的形态和结晶结构。
Since the quality of metallographic sample has great effect on the accuracy and precision of testing results, several preparations of electron backscatter diffraction(EBSD) sample are introduced.
电子背散射衍射样品的制备质量对其成像效果的影响至关重要，着重介绍了几种有效的样品制备方法。
Straight carbon nanotubes with multishells produced by arc discharge and pyrolysis of organic gases using metal particles as catalysts have been investigated by means of electron diffraction.
本文对电孤放电和催化剂热解碳氢气法制备的多层直形纳米碳管的倒空间及其螺旋度，采用电子衍射进行了研究。
The constituents and the structures of the diamond films have been identified by means of scanning electron microscopy (SEM), Raman spectroscopy and X-ray diffraction.
利用扫描电子显微镜（SEM ）、显微喇曼光谱、X射线衍射等手段对合成的金刚石薄膜的成分与结构进行了分析。
The crystallization and microstructure of the glass were investigated using scanning electron microscopy and X-ray diffraction technique.
用扫描电子显微镜和X射线衍射技术分析了微晶玻璃析晶和显微特征。
In this paper a computer program was described, which is designed for analysis of polycrystalline electron diffraction pattern of a multi-phase system.
本文介绍为分析多相体系的多晶电子衍射图而设计编写的计算机程序。
Optical metallographic microscope, micro-hardness tester, electron microprobe and X-ray diffraction analysis were applied to explore the process of intermediate temperature tempering transformation.
利用光学金相显微镜、显微硬度计、电子探针及X射线衍射分析仪初步探索其中温回火转变过程。
The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).
该薄膜的表面形态和特征采用扫描电子显微技术(SEM)，X射线衍射(XRD)以及原子力显微技术(afm)描述。
The inheritance phenomenon of precipitated V_4C_3 in martensitic transformation has been investigated by means of electron diffraction and matrix analysis.
本文利用电子衍射和矩阵分析方法探讨了析出V_4C_3在马氏体相变中的遗传现象。
The selected area electron diffraction (SAED) pattern of the twin was indexed by transforming matrix of hexagon crystal twin plan.
并采用六方晶系孪晶面的变换矩阵对孪晶电子衍射花样进行了标定。
The resolution of the structure image so obtained may be higher than that of the original electron micrographs and may approach the diffraction limit.
所得结构图像的分辨本领将优于电子显微图，而有可能接近于衍射分辨极限。
The structures of the samples were analyzed by X-ray diffraction, and the impedance spectra and electron paramagnetic resonance spectra were measured.
用X射线衍射仪检测了样品的结构，测量了样品的阻抗谱和电子顺磁共振谱。
The morphology, structure, and photoluminescence(PL) of the phosphors were investigated by transmission electron microscope(TEM), X-ray diffraction(XRD), emission spectra, and decay time.
以X射线衍射（XRD）、透射电子显微镜（TEM）、发射光谱和衰减时间谱等手段表征材料性能。
The state of electron is described by wave function. Intensity distribution of single slit electron diffraction is derived by probability distribution of electron momentum.
电子状态用波函数描述，由电子动量的概率分布，得到电子单缝衍射的强度分布。
The high-resolution images and corresponding electron diffraction patterns of YBCO films were obtained with the aid of high-resolution transmission electron microscope(HRTEM).
在高分辨透射电子显微镜（HRTEM）下获得了薄膜的高分辨图像及电子衍射花样。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The prepared product has been characterized by means of X-ray diffraction (XRD) and scanning electron micrography (SEM).
通过X射线粉末衍射（XRD）和扫描电子显微镜（SEM）对产物进行了表征。
The structural change of PAN based carbon fibre by an electric current pulse was studied by means of X-ray diffraction(XRD) and transmission electron microscopy(TEM).
用X射线衍射（XRD）、透射电子显微镜（TEM）等技术研究了PAN基碳纤维在单电流脉冲作用下的结构变化。
The resolution index of electron diffraction in TEM is analyzed. The exactly experimental method is given for demarcating electron diffraction camera length by Gold-monocrystal in TEM.
同时对TEM中的电子衍射分辨率指数进行了分析和讨论，并给出了实际应用金单晶标样精确标定TEM电子衍射相机长度的实验方法。
Moreover, the original surfaces and the fretted surfaces and cross-sections of the coatings were analyzed by means of scanning electron microscopy and X-ray diffraction.
基于微动损伤表面和截面扫描电子显微分析以及涂层原始表面和微动磨损表面X射线衍射分析，探讨了几种涂层的微动损伤机理。
A new kind of method for studying critical materials-electron backscatter diffraction (EBSD) analysis technology was introduced.
介绍了一种新型的晶体材料研究方法——电子背散射衍射分析技术。
A new kind of method for studying critical materials-electron backscatter diffraction (EBSD) analysis technology was introduced.
介绍了一种新型的晶体材料研究方法——电子背散射衍射分析技术。
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