A formal potential solution for the diffraction problem was established, and the computational formulation for the corresponding diffraction force was given.
基于分离变量方法，建立了绕射势的级数解，导出了作用于大直径桩柱上的绕射力的计算公式。
The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
In addition, the microstructure of the MgO thin films were examined with X-ray diffraction (XRD), Atomic Force Morphology (AFM) and Transmission Electron Micrograph (TEM).
同时，用X射线衍射(XRD)、原子力显微电镜(afm)和透射电镜(TEM)对薄膜的微观结构进行了分析。
The structural and magnetic properties of the granular film are studied by atomic force microscope, energy dispersion X-ray spectrum, X-ray diffraction, and alternating gradient magnetometer.
利用原子力显微镜、能量散射X射线谱、X射线衍射和交变梯度磁强计研究了该颗粒膜材料的结构和磁学性质。
The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).
该薄膜的表面形态和特征采用扫描电子显微技术(SEM)，X射线衍射(XRD)以及原子力显微技术(afm)描述。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
Maxwell equations: Lorentz force, plane electromagnetic waves, radiation, light waves, reflexion, refraction, Huyghens principle, diffraction, interference phenomena.
麦克斯韦方程组：洛仑兹力，平面电磁波，辐射，光波，反射，折射，惠更斯原理，衍射，干涉现象。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
Role of the cavity field, the electrostatic repulsive force at the domain boundary and self-enhanced diffraction light induced by physical imperfection on laser-induced surface damage are discussed.
本文讨论了由晶体缺陷所致的自增强衍射光，富集于缺陷的空间电荷所致的空洞场，以及由此场导致的发生在畴界上的静电斥力对此损伤所起的作用。
The crystal structure is characterized by X-ray diffraction (XRD) and the morphological characterizations are observed by atomic force microscopy (AFM).
用X射线衍射来表征晶体的结构，用原子力显微镜来表征表面形貌。
The crystal was characterized by four-crystal X-ray diffraction, chemical etching, optical microscope, transmission spectra and atomic force microscope (AFM).
通过四晶X射线衍射、化学腐蚀、光学显微、透过光谱以及原子力显微镜对晶体的质量进行了表征。
The key of this paper is the solution of the second-order double-frequency wave exciting force for a floating body sailing in waves by solving second-order diffraction potential.
本文的关键是通过求解二阶绕射速度势获得三维移动物体的二阶倍频波浪力。
The key of this paper is the solution of the second-order double-frequency wave exciting force for a floating body sailing in waves by solving second-order diffraction potential.
本文的关键是通过求解二阶绕射速度势获得三维移动物体的二阶倍频波浪力。
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