The X-ray diffraction (XRD), excitation, emission and phonon side band spectra of the upper and lower parts of crystals were measured.
测定了晶体下部与上部的X射线衍射图（XRD）、激发光谱、荧光光谱以及声子边带谱。
The synthesized sample was characterized by X-ray diffraction, excitation and emission spectroscopy.
对样品进行了X射线衍射分析和光谱分析。
The structure and cathodoluminescence properties were studied by the X ray diffraction (XRD) and the cathode ray excitation.
在研究交流气体放电X射线性质时 ，实验观测到了强度可与阳极X射线相比的阴极X射线。
The structure and cathodoluminescence properties were studied by the X ray diffraction (XRD) and the cathode ray excitation.
在研究交流气体放电X射线性质时 ，实验观测到了强度可与阳极X射线相比的阴极X射线。
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