The Modbus network address of the device under test.
测试设备的Modbus网络地址。
The communication data-transfer rate between the host and the device under test.
主机和测试设备之间的通信数据传输速度。
The parity setting for communication between the host and the device under test.
主机和测试设备之间的通信的奇偶校验设置。
The number of stop bits for communication between the host and the device under test.
主机和测试设备之间的通信的停止位数。
The physical type of the cable connector used to link the device under test and the host
用于链接测试设备和主机的电缆连接器的物理类型。
Examples of the invention can relate to an apparatus for testing a device under test (DUT).
本发明的例子涉及用于测试待测器件(DUT)的装置。
Request the contents of Modbus registers on the device under test through standard Modbus commands.
通过标准的Modbus命令请求测试设备上的Modbus寄存器的内容。
However, in some cases, shielding the device under test or the connecting cabling isn't practical.
然而，在有些情况下，将被测设备或连接电缆屏蔽起来是不实际的。
The protocol being used for communication with the device under test; used for documentation purposes only
用于与测试设备通信的协议；仅用于文档目的。
The offset voltage will cause an error in the applied stimulus to a device under test or the value measured by the voltmeter.
偏移电压会导致施加到被测装置的激励发生误差，或者使伏特计的测量值发生误差。
Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).
通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚，可以进一步减少处理时间。
If high voltage is used, current limiting resistors are needed to avoid damage to the current switches in case the device under test breaks down.
如果使用高压，则需要利用限流电阻，以免被测装置击穿后损坏电流开关。
A disadvantage of the cascade configuration is that the signal may pass through more than one switch contact to the device under test, causing higher losses in the signal.
级联配置的一个缺点是信号要经过多个开关触点才能到达被测装置，会造成信号的损耗更高。
Often, the purpose of the contact resistance test is to determine whether contact oxidation or other surface film buildup has increased the resistance of the device under test.
通常，测试接点电阻的目的是确定接触点氧化或其它表面薄膜积累是否增加了被测器件的电阻。
Subsequent command pairs starting with 0b and 0c are request and verification rule commands, respectively, used to extract and check values extracted from Modbus registers on the device under test.
以0b和0c开头的后续命令对分别是请求和验证规则命令，用于提取和检查从测试设备上的Modbus寄存器提取的值。
Unlike a voltage measurement, a charge measurement can be a destructive measurement. In other words, the process of making the measurement may remove the charge stored in the device under test.
与电压测量不同，电荷测量可能是破坏性测量，换言之，进行测量的过程可能会消除被测器件中储存的电荷。
Unlike a voltage measurement, a charge measurement can be a destructive measurement. In other words, the process of making the measurement may remove the charge stored in the device under test.
与电压测量不同，电荷测量可能是破坏性测量，换言之，进行测量的过程可能会消除被测器件中储存的电荷。
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