It is a crucial step for destructive physical analysis (DPA) and failure analysis (fa) to remove the plastic package for the die exposing.
去除塑料包封层,露出芯片表面,是DPA(破坏性物理分析)及FA(失效分析)的关键一步。
The destructive physical analysis (DPA) is used to detect the semiconductor devices.
分析(DPA)是用于检测半导体器件的。
The destructive physical analysis (DPA) is used to detect the semiconductor devices.
分析(DPA)是用于检测半导体器件的。
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