After each stage of the etching process a fixed depth of this is dissolved away, exposing a different part of the circuit to the etching chemicals.
在蚀刻技术的每个阶段，固定高度的阻材料层会消失，暴露出不同部分的电路进行化学物质的侵蚀。
Identity CARDS washed the length of time will determine the depth of etching the word sign.
五星级标识牌冲刷时间的长短就决定了标牌字的蚀刻的深度。
Based on the diffraction optical principle, a formula of the diffraction efficiency and etching depth error of the microlens is obtained.
基于衍射光学原理，获得了微透镜的衍射效率与蚀刻深度误差之间的关系式。
It shows that the measurement result of etching depth is quite influenced by the vibration of sensitive element.
表明敏感元件的振动对蚀刻深度的测量结果有较大影响。
Experimental curves of etching depth versus repeated rate and radiation time of laser pulse are given.
同时给出了刻蚀深度与脉冲速率及脉冲时间的实验曲线。
The etching depth of the circles showed a decreasing trend in the same processing conditions.
比较了相同实验条件下直线轨迹与圆环轨迹的刻蚀深度。
The edges of the grooves after etching are plane and smooth. The depth and width of the grooves can solve the interference problem induced by the injection current between the adjacent pixels.
腐蚀后的上隔离沟槽边缘平整，其深度和宽度可以解决注入电流在相邻像素之间产生的干扰问题。
With the increase of etching depth, the generated particles are difficult to escape from micro-structures, causes so that the ablation rates decreases.
随着刻蚀深度的增加，光解生成物的脱出变得困难，从而导致刻蚀速率的降低。
The coupling problem between sensitive element and sensing element in etching depth sensor is discussed.
对离子束蚀刻深度传感器敏感元件与传感元件间的耦合问题进行了探讨。
A new method for testing the acid etching depth of WC-Co cemented carbide by flame atomic absorption spectrometry and glow discharge spectrometry has been studied.
研究了原子吸收光谱法和辉光放电光谱仪定量测定硬质合金去钴深度的新技术。
The distribution of residual stress along depth gained through layer-by-layer measuring method after chemical etching is in line with that measured by multi-wavelength method.
化学蚀刻后逐层测试所得应力沿深度分布与用多波长法测试结果趋势一致，大小略有差异。
The distribution of residual stress along depth gained through layer-by-layer measuring method after chemical etching is in line with that measured by multi-wavelength method.
化学蚀刻后逐层测试所得应力沿深度分布与用多波长法测试结果趋势一致，大小略有差异。
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