In film defect detection and reparation, scratch is a common type of film detects which is hard to detect.
在电影胶片降质检测和修复中，划痕是最为常见且较难检测的一种胶片降质。
Surface defect of steel ball is main reason for bearing fail. This paper developed a sort of surface defect detect system based on machine vision to apply in steel ball.
由于钢球表面的缺陷是造成轴承失效的主要原因，本文研发一种面向轴承企业应用基于机器视觉的钢球表面缺陷检测系统。
In the experiments, the symmetric and antisymmetric modes, S1 and A1, were excited to detect hidden corrosion defect respectively using pitch-catch technique.
实验中，采用了一发一收法，并分别激励了对称模态s1和反对称模态A 1对该缺陷进行了检测。
By oil immersion coupling. the system can be used to detect near surface defects with focussing probe. find surface cracks with surface wave probe and determine defect size with computerized C-scan.
该装置采用全油浸耦合，用聚束探头检测近表面缺陷，用表面波检测表面裂纹，用计算机化c扫描定量缺陷尺寸。
Effect distribution curves of scanning interval and defect sizes on detecting results are obtained by experiment, and it can supply references to detect defect sizes reasonably.
通过实验，给出了缺陷尺寸和扫描间隔等因素对检测结果影响的分布曲线，为合理提取缺陷尺寸提供了参考。
This method can detect all kinds of hidden defect type of the solar cells.
该方法可以检测出正向偏压下电池存在的各种缺陷类型。
This plate shape detecting device can be easily transplanted to the actual production field to detect the plate shape and surface defect online.
该板材板形检测装置易于移植到实际生产现场进行在线板形和表面缺陷检测。
Another set USES dedicated pattern recognition routines to detect different types of hybridisation defect in replicates.
另一个的集使用专用的模式识别程序例程来检测杂交缺陷的不同类型的复制。
ICT can detect gray image of the object's layer and does not destruct the object in the same time. ICT distinguish object layer's geometrical structure, material and defect type by gray.
ICT是在无损状态下检测物体断层的灰度图像，以其灰度来分辨被检测断面内部的几何结构、材质情况、缺陷种类等。
They are also suitable for detect other common log defect types.
该方法同样适用于原木其他内部缺陷的检测。
Aim at the problem above, a method that USES extended defect pattern state machine to detect defects is given.
针对上述问题，本文提出了使用扩展的缺陷模式状态机进行缺陷检测的方法。
Aim at the problem above, a method that USES extended defect pattern state machine to detect defects is given.
针对上述问题，本文提出了使用扩展的缺陷模式状态机进行缺陷检测的方法。
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