Further analysis shows that it is caused by the enhancement of the threshold current density and threshold carrier density in terms of optical-gain spe.
进一步分析认为，这是因为条宽变窄导致器件阈值电流密度、阈值载流子密度变大造成的。
Concerns BEM (boundary element method) of electric current concentrating effect and temperature rising analysis at the crack tip with high density electric pulse.
给出金属板在高密度电流脉冲下裂纹尖端电流集肤效应和急剧发热升温解析的边界元法。
Concerns BEM (boundary element method) of electric current concentrating effect and temperature rising analysis at the crack tip with high density electric pulse.
给出金属板在高密度电流脉冲下裂纹尖端电流集肤效应和急剧发热升温解析的边界元法。
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