The polarization curves of copper physical development (CuPD) system were obtained by transient constant current step method on copper plated platinum electrode.
本文采用镀铜铂电极和暂态恒电流阶跃的方法测得了铜物显（铜物理显影）体系的极化曲线。
The polarization curves of copper physical development (CuPD) system were obtained by transient constant current step method on copper plated platinum electrode.
本文采用镀铜铂电极和暂态恒电流阶跃的方法测得了铜物显（铜物理显影）体系的极化曲线。
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