To assure the precision of evaluations and predictions, a good software reliability model should have the function of describing test coverage and can reflect the fault repair process.
为了保证可靠性模型的估测精度，好的软件可靠性模型应该包括对测试覆盖的说明，并且能够反映软件的错误修复过程。
The markov model is applied to analyze the influence of fault detection coverage and diagnosis success rate for system availability.
通过建立马尔科夫模型，分析了双机系统的可用性，研究了故障检测覆盖率和故障诊断成功率对系统可用性的影响。
Finally, the loss of fault coverage due to the introduction of the parity tree is analyzed, and the detection of faults in the parity trees are described.
最后，分析了由于奇偶树的引入带来的故障覆盖率的损失及奇偶树中故障的检测。
The configuration structure of test, the fault coverage, the implementation problems and their solutions were discussed.
文章给出了应用这种方法进行测试的配置结构、故障覆盖率和测试中出现的问题及其解决办法。
The results of experiments suggest a higher fault coverage is achieved.
实验结果表明，故障覆盖率取得了满意的结果。
The experiments show that the proposed method can reduce peak power, average power and energy simultaneously at the cost of a little fault coverage dropping.
实验表明，在稍微降低故障覆盖率的条件下，本文提出的测试方法能显著降低测试的峰值功耗，同时也能降低平均功耗和能耗。
With ensuring the fault coverage, the adaptive scan can be ten-fold reduction in the number of test vectors, thus reducing test time and ultimately reduce the cost of chip.
自适应的扫描压缩方法在保证故障覆盖率的前提下，能够数十倍的减少测试矢量，进而减少测试所需时间，最终降低芯片成本。
In order to reduce the loss of the fault coverage when using the parity tree to compact the test response, a method of grouping compaction of the output pins is proposed in the paper.
为了减少利用奇偶树压缩测试响应时的故障覆盖损失，提出了一种输出端分组压缩的方法。
This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high fault coverage and short time is then presented fort…
本文论述了板级边界扫描测试存取口的故障模型和测试原理，并针对全边界扫描印制板提出了一种故障覆盖率高、测试时间短的测试算法。
This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high fault coverage and short time is then presented fort…
本文论述了板级边界扫描测试存取口的故障模型和测试原理，并针对全边界扫描印制板提出了一种故障覆盖率高、测试时间短的测试算法。
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