• In the next section on component-scanning, a non-XML alternative will be presented.

    下文的组件扫描部分,我们呈现一个可供选择非XML方法。

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  • One final topic to address here is the simplification of qualifier annotations when using component-scanning.

    这里指出最后一点使用组件扫描qualifier注解应用是多么的简单。

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  • Instead of doing the resource scanning for every component, we just do it once, properly delegating the work to various container components.

    现在无需每个组件进行资源扫描我们只需一次即可,可以将工作委托各种容器组件实现。

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  • It is not necessary to completely supplant configuration in XML, rather the component scanning can operate alongside XML metadata to simplify the overall configuration.

    全面替代XML中的配置不再必要组件扫描反而可以处理XM L元数据简化整体配置。

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  • Clearly it is possible to extend the component scanning in a number of ways to register your own custom types.

    明显,有很多方法可以扩展组件扫描注册定义的类型。

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  • And you enable annotation configuration and component scanning in the Spring application context XML configuration, as shown in Listing 5.

    然后Spring应用程序上下文XML配置启用注释配置组件扫描如清单5

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  • The component scanning functionality can remove the need for even that minimal bean definition in XML.

    组件扫描功能使得这个XML最起码bean定义不再存在需求性。

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  • With component scanning, there is no longer a need for those explicit XML bean definitions.

    利用组件扫描不再需要这些显式XMLbean定义

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  • As Ales Justin writes in his article: "The main goal or idea behind this library is very simple: unify all of JBossAS component scanning into a single-pass scan."

    AlesJustin文章写到这个背后想法非常简单:将所有JBoss AS扫描组件统一单独的库中”。

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  • Methods: The main active component icariin of Herba Epimedii was determined by TLC scanning.

    方法采用薄层扫描法淫羊主要有效成分淫羊甙进行含量测定

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  • Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.

    原子显微镜AFM探针系统典型的微机械构件接触扫描过程处于耦合变形状态

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  • Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.

    用俄歇电子能谱(AES)、扫描电镜(sem)原子显微镜(afm)对薄膜组成成分表面形貌进行了分析

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  • The invention discloses an active component array substrate, which comprises a substrate, a plurality of scanning wires, a plurality of data wires and a plurality of pixel units.

    发明公开了一种主动元件阵列板,包括一基板、多条扫描配线、多条数据配线以及多个像素单元。

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  • According to the output scanning curve, we can obtain the best range of component parameters from the considerations of theory and experiment.

    根据这些扫描曲线理论实验角度,给出元件最佳选取范围

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  • The principle, component, components, work process, accuracy analysis and application in the fulfillment of the 3D laser scanning system based on machine vision is discussed in the paper.

    本文讨论了一种基于计算机视觉原理激光扫描测量系统原理,组成工作过程精度分析工程实际中的应用

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  • Thereby, the impact of the manufactural accuracy on the scanning accuracy must be emphasized for laser radar liquid crystal phased-array component.

    扫描精度激光雷达液晶相控阵扫描组件一个重要指标。

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  • Basing on the analysis on traditional connected component detection algorithm, this paper developed a new connected component detection algorithm basing on image plane scanning.

    分析讨论传统二值图象通体检测原理的基础设计了一种新的二值图象连通区域检测算法

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  • The surface morphology and the component of the film has been analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectrometer (XPS).

    并利用扫描电子显微镜(sem)x -射线光电子(XPS)薄膜形貌组分进行了表征。

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  • After scanning the object image and labeling the connected component, the background and foreground noise could be removed easily by threshold value area expunction.

    该方法仅需对图像作一次全扫描即可标记物体所有连通部分,统计标识号,根据阈值面积消除法即可快速去除图像中所有前景背景噪声

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  • After scanning the object image and labeling the connected component, the background and foreground noise could be removed easily by threshold value area expunction.

    该方法仅需对图像作一次全扫描即可标记物体所有连通部分,统计标识号,根据阈值面积消除法即可快速去除图像中所有前景背景噪声

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