With the help of optical microscope (OM) and color metallography, the interface migration and its influencing factors were investigated during vacuum holding process.
用光学显微镜和彩色金相技术，研究了真空保温过程中界面的迁移情况及其影响因素。
With the help of optical microscope (OM) and color metallography, the interface migration and its influencing factors were investigated during vacuum holding process.
用光学显微镜和彩色金相技术，研究了真空保温过程中界面的迁移情况及其影响因素。
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