Yield of the redundant circuit is analyzed with IC critical area and the computational model of this redundant circuit is given.
利用关键面积的思想分析了冗余电路的成品率，并给出了其计算模型。
In the manufacture process of integrated circuit (IC), lithography occupy a very important step, and the quality of photomask used in lithography affects the yield of LSI.
光刻是大规模集成电路生产流程中十分关键的一环，而光刻中使用的掩模的质量对大规模集成电路的成品率有很大的影响。
Test result shows that the circuit decreases the effect of temperature to anode current, improves the stability of neutron yield.
测试结果表明，该电路减小了温度对阳极电流的影响，改善了中子产额的稳定性。
An increase in chip area and circuit complexity leads to a reduction in the yield of chip production. In order to get a fair yield, the fault tolerant technique is introduced into the IC design.
随着芯片面积的增加及电路复杂性的增强，芯片的成品率逐渐下降，为了保证合理的成品率，人们将容错技术结合入了集成电路。
Parameters of optimum design make higher yield and finer production size while reducing the circuit burden.
优化设计的参数使得产量更高、粒度更细，从而降低了循环负荷。
Experience example demonstrates that the proposed method is very useful in yield analysis of electronic circuit design.
算例表明，该方法对电路设计进行快速成品率分析及电路的稳定性设计具有较好的应用前景。
Experience example demonstrates that the proposed method is very useful in yield analysis of electronic circuit design.
算例表明，该方法对电路设计进行快速成品率分析及电路的稳定性设计具有较好的应用前景。
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