The invention can effectively position a defect memorizer without increasing the chip area, and is convenient for defect analysis and design improvement.
本发明能在不增加任何芯片面积的前提下，有效的定位缺陷存储器，方便缺陷分析和设计改进。
The invention can effectively position a defect memorizer without increasing the chip area, and is convenient for defect analysis and design improvement.
本发明能在不增加任何芯片面积的前提下，有效的定位缺陷存储器，方便缺陷分析和设计改进。
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