A method is presented for measuring the minority recombination Lifetime in MOS fet's by charge pumping effect.

本文介绍了应用电荷抽取效应测量MOS晶体管中少子复合寿命的方法。

youdao

A method is presented for measuring the minority recombination Lifetime in MOS fet's by charge pumping effect.

本文介绍了应用电荷抽取效应测量MOS晶体管中少子复合寿命的方法。

youdao