Based on progressively censored sample, the problems of estimating the reliability performance for compound system with electronic components are studied by using Bayes and MLE approaches.
在逐次截尾样本下,研究电子元件混联系统可靠性指标的估计问题。
In the case of K type interval censored data, the lower confidence limit of parameter is studied based on the order relation established in the sample space.
基于K型区间删失数据,利用样本空间排序法给出参数优良的置信下限和计算置信下限的递推公式。
In the case of K type interval censored data, the lower confidence limit of parameter is studied based on the order relation established in the sample space.
基于K型区间删失数据,利用样本空间排序法给出参数优良的置信下限和计算置信下限的递推公式。
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