Some factors which affect the properties of BYT thin films were discussed.
并就影响BY T薄膜铁电性能的因素进行了分析。
The X-ray diffraction(XRD) were employed to analyze the structure and composition of BYT thin films. The ferroelectric measurements were performed using a RT66A ferroelectric tester.
用X射线衍射法对其结构及其成份进行了表征，用铁电分析仪（RT66A）测试了其铁电性。
The X-ray diffraction(XRD) were employed to analyze the structure and composition of BYT thin films. The ferroelectric measurements were performed using a RT66A ferroelectric tester.
用X射线衍射法对其结构及其成份进行了表征，用铁电分析仪（RT66A）测试了其铁电性。
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