The X-ray diffraction(XRD) were employed to analyze the structure and composition of BYT thin films. The ferroelectric measurements were performed using a RT66A ferroelectric tester.
用X射线衍射法对其结构及其成份进行了表征，用铁电分析仪（RT66A）测试了其铁电性。
Some factors which affect the properties of BYT thin films were discussed.
并就影响BY T薄膜铁电性能的因素进行了分析。
Some factors which affect the properties of BYT thin films were discussed.
并就影响BY T薄膜铁电性能的因素进行了分析。
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