On the basis of this, a method of using twice sweep under different voltage sweep rates for determining both bulk generation lifetime and surface generation velocity is proposed.
在此基础上，建议了一种通过两次不同电压扫描率的线性电压扫描来测定半导体的体产生寿命和表面产生速度的方法。
On the basis of this, a method of using twice sweep under different voltage sweep rates for determining both bulk generation lifetime and surface generation velocity is proposed.
在此基础上，建议了一种通过两次不同电压扫描率的线性电压扫描来测定半导体的体产生寿命和表面产生速度的方法。
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