The electron microscope uses a beam of electrons to produce images at high magnifications.
电子显微镜利用一束电子产生高倍放大的影像。
我们有一个电子束。
TEMs work by firing a beam of electrons through the material and measuring how it absorbs and deflects the particles to build up an image of the sample.
TEMs 的工作原理是通过发射一束电子穿过某种物质，并测量它如何吸收和偏转粒子来建立样本的图像。
The microscope works by scanning a focused beam of electrons across an object.
扫描电子显微镜是通过扫描聚焦在物体上的电子束来工作的。
Thee microscope works by scanning a focused beam of electrons across an object.
扫描电子显微镜是通过扫描聚焦在物体上的电子束来工作的。
In electron microscopes a beam of electrons instead of a beam of light is directed onto the specimen.
在电子显微镜下，常使用一束电子光而不是普通光线来为标本照明。
But when they are zapped with a beam of electrons from a particle accelerator, the polymer chains are desaturated.
但是，当它们经过粒子加速器发射的电子束扫描后，聚合分子链被去饱和。
On April 8th 1982 Dr Shechtman fired a beam of electrons at a slice of aluminium-manganese alloy, in order to understand its crystal structure.
1982年4月，Shechtman博士向一片铝锰合金发射了一束电子，以便了解晶体的内部结构。
Amazingly enough, a beam of electrons had thus been diffracted in a manner completely analogous to a light wave bouncing off a reflection grating.
一束电子波衍射的方式，同光波从一个反射光栅上弹回的方式完全类似，这真是不可思议。
This photomicrograph was obtained by scanning a beam of electrons across the sample while a detector kept track of electrons bouncing off its surface, betraying the specimen's outer shape.
这幅显微照片是通过扫描穿过样品的电子束而获得的，同时检测器对从样品表面反弹的电子进行追踪，这些电子显示了标本的外形。
Only relatively pristine material has the goods Landman is after, so his team USES a scanning electron microscope (below), which utilizes a beam of electrons to image surfaces, to find the best nacre.
只有相对原始状态的材料才拥有兰德曼所需要的研究对象，因此他的研究小组必须使用利用电子束表面成像的扫描电子显微镜(下图)去寻找最好的珍珠层。
Considering the disturbance of the plasma electrons at the beam-ion channel boundary, the eigen-equation of TM mode has been derived.
考虑束-离子通道边界上等离子体电子可能发生的扰动，导出了TM模本征方程的理论式。
The elastic and inelastic scattering of low energy electrons in solids and some of its applications in electron beam microanalysis are described.
本文介绍了低能电子在固体中的弹性散射和非弹性散射，及其在电子束显微分析中的一些应用。
We have computed the wiggler parameters, efficiency of energy conversion between electron beam and laser field, laser intensity, phase-space distributions and energy spectrum of electrons.
计算了摆动器参数、电子束和激光场之间的能量转换效率、激光强度、电子的相空间分布和能谱。
And are analysed the influence on the two self-fields resulting from the finite cross-section of the beam and that resulting from the fact that the axes of the individual electrons don't coincide.
分析了电子束有限截面以及各电子的螺旋轨道不共轴对这二个自生场的影响。本文的结果有助于弄清螺旋电子束与其他电子束相互作用时的平衡态情况。
The electron beam ion trap(EBIT) and the electron ion source(EBIS) are new instruments for the study of X-ray produced by very highly-charged ions when they interact with free electrons.
利用电子束离子源（EBIS）或者电子束离子陷阱（EBIT）产生的慢速高电荷态重离子束轰击金属靶面，离子束与靶面作用并复合辐射特征X射线；
Under the condition of small amplitude, the operating equations of the wiggler are given, and then, the trajectories of the beam electrons and the angular spectrum of spontaneous emission are derived.
在小振幅条件下，给出了摆动器的工作方程，导出了束电子的运动轨迹和自发辐射谱分布。
Using 3d test particle simulation, the interaction of slow electrons with the combined laser beam in vacuum is investigated.
采用三维测试粒子模拟，研究了电子和组合激光束的相互作用。
There exists great importance in the investigation both into the fundamental physics related to the beam-wave interaction and into the rule of electrons movement in this device.
深入研究其内部的电子运动规律和束波相互作用的物理机制具有重要意义。
Based on the photoelectric effect, when a beam of monochromatized radiation is shined on a sample, electrons are emitted and escape to the vacuum (Fig. 1).
利用光电效应的原理，我们用深紫外光照射样品，并探测出射的光电子（图一）。
Based on the photoelectric effect, when a beam of monochromatized radiation is shined on a sample, electrons are emitted and escape to the vacuum (Fig. 1).
利用光电效应的原理，我们用深紫外光照射样品，并探测出射的光电子（图一）。
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