Finally, we analyse the performance of loosely coupled mode parallel ATPG algorithms.

最后，我们对松耦合模式的并行atpg算法进行了性能分析。

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The analyses reveal that, compared with traditional tightly coupled mode parallel ATPG algorithms, loosely coupled mode parallel ATPG algorithms can reduce time and memory overhead in theory.

分析表明，和传统的紧耦合模式的并行atpg算法相比，松耦合模式的并行atpg算法能够减少时间和存储开销。

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This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).

本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。

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This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).

本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。

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