Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
原子力显微镜是运用一种微小的探针去“感受”样本表面，能得到高分辨率的影像（约5纳米的分辨率）。
Atomic absorption spectrometry (AAS), scanning electron microscopy (SEM), and energy dispersive X-ray spectrometry (EDXS) are carried out to characterize the deposition on fiber probe.
通过使用原子吸收光谱仪，扫描显微镜和能量色散X射线谱仪对覆膜光纤探针进行表征。
The film and its surface morphologies of amino-polysiloxane were observed and studied by means of atomic force probe microscopy(AFM) and contact angle measurement instrument.
应用原子力显微镜（AFM）和接触角测量仪对乙酸酐改性氨基聚硅氧烷的成膜性及膜形态进行了研究。
The distance between the terminal atom and the probe of conduction atomic force microscopy is quite flexible, and the electronic transport properties of molecules are sensitive to the distance.
分子末端原子与探针的距离具有较大地自由度，不同的接触距离导致了分子的电流值有较大地差别。
The distance between the terminal atom and the probe of conduction atomic force microscopy is quite flexible, and the electronic transport properties of molecules are sensitive to the distance.
分子末端原子与探针的距离具有较大地自由度，不同的接触距离导致了分子的电流值有较大地差别。
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