An image of a circuit with 17 memristors captured by an atomic force microscope.
原子力显微镜拍摄的17个忆阻器构成电路的图像。
Using an atomic force microscope and two layers of insulators (lanthanum aluminum oxide and strontium titanium oxide), Levy and his colleagues created a nanoscale transistor.
列维和他的同事们用原子力显微镜和两片绝缘体（镧氧化铝和锶钛氧化物），研制出了一枚纳米晶体管。
A novel atomic force microscope (AFM) for large samples to be measured in liquid is developed.
研制了一种适用于大样品的新型液相原子力显微镜。
And the surface texture data by atomic force microscope (AFM) are obtained.
用原子力显微镜作为测量工具，获取表面形貌数据。
A measuring system of film thickness based on atomic force microscope has been developed.
研制了一种基于原子力显微镜的薄膜厚度检测系统。
AIM: to investigate the application of atomic force microscope (AFM) in clinic diagnosis.
目的：初步探讨原子力显微镜在临床病理学检验中的应用前景。
The atomic force microscope can detail the shapes of particles as small as about 100 nanometers.
这种原子力显微镜能够扫描象100纳米一样小的颗粒的形状。
To observe linear DNA with atomic force microscope (AFM) and investigate the imaging conditions.
用原子力显微镜(afm)观察线性DNA并探讨其成像条件。
All these data indicated that atomic force microscope is a visual tool to study the cytoskeleton.
原子力显微镜是研究细胞骨架的一种可视化的工具。
Optical lever method is a main technique to detect the cantilever's position in atomic force microscope (AFM).
光杠杆法是原子力显微镜(afm)悬臂定位的主要方法。
Designed an automatic control system of 42m-1.8d motor, which can be widely used in the atomic force microscope.
设计出一套能微纳米运动的42M- 1.8D电机自动控制系统，可广泛应用于大部分原子力显微镜。
Changes in surface roughness after gas cluster ion bombardments have been measured by an atomic force microscope.
用原子力显微镜测量了气体离化团束照射后表面粗糙度的变化。
Working at tapping mode, atomic force microscope(AFM) piezoelectric microcantilever vibrates with large amplitude.
在轻敲工作模式下，原子力显微镜（AFM）压电微悬臂以较大的振幅振动。
A novel large-stage atomic force microscope (AFM) for nondestructive characterization of optical thin films is built.
研制了一种用于大面积光学薄膜表面无损表征的新型原子力显微镜(afm)。
The Young's modulus of silicon nano-beam on <100> direction was measured by bending test method using an atomic force microscope(AFM).
阐述了基于原子力显微镜（AFM）的弯曲测试测量纳米梁杨氏模量的理论和方法。
Dynamic electric force microscopy was set up on a commercial atomic force microscope (AFM) to study the polarization of single nanocrystal.
在现有的商用原子力显微镜上实现了用动态电场力显微术来研究单个纳米颗粒的极化特性。
On the basis of micro-fabrication technique using the atomic force microscope, a new method was proposed for producing high frequency grating.
在扫描探针纳米加工技术的基础上，提出了利用原子力显微镜（AFM）来制作高频光栅的新工艺。
The theory and method of bending test on nanobeam for the measurement of Young's modulus based on atomic force microscope (AFM) are introduced.
阐述了基于原子力显微镜(afm)的弯曲测试测量纳米梁杨氏模量的理论和方法。
The thermoplastic polyurethane (TPU) is prepared with mixer by one-step, and it's micro-phase separation is studied by atomic force microscope (AFM).
用一步法在密炼机中合成了热塑性聚氨酯（TPU）。在原子力显微镜（ AFM）下观察其微相分离情况。
The tungsten oxide films by two methods were characterized by atomic force microscope, double-beam UV-VIS-NIR spectrophotometer and X-diffractometer.
本文分别用原子力显微镜、双束紫外可见分光光度计、X-衍射仪等表征了用以上两种方法制备的三氧化钨薄膜。
The usage of AFM(atomic force microscope), which is a new method of surface test, in studying the fine structure of natural pig collagen was discussed.
简要介绍了原子力显微镜这一新型表面测试技术在猪皮胶原精细结构研究中的应用方法。
This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.
文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。
The characters of surface morphology of pure aluminum matrix composites were observed by atomic force microscope (AFM) during the early stages of corrosion.
利用原子力显微镜观察了纯铝基复合材料早期腐蚀过程中表面形貌的变化特征。
The crystal was characterized by four-crystal X-ray diffraction, chemical etching, optical microscope, transmission spectra and atomic force microscope (AFM).
通过四晶X射线衍射、化学腐蚀、光学显微、透过光谱以及原子力显微镜对晶体的质量进行了表征。
The surface of the gold film, the microstructure of the polyurethane film and the surfaces with adsorbed proteins were imaged with an atomic force microscope (AFM).
同时应用原子力显微镜对金膜和聚氨酯材料的超微结构与材料表面上所吸附的蛋白质进行了表征。
Force modulation atomic force microscope and linear scanning system of scanning electron microscope were carried out to analyze the microstructure of composite interface.
采用力调制原子力显微镜及扫描电镜的线扫描功能对复合材料界面相精细结构进行分析。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
An experiment was conducted to study the high-temperature annealing characteristics of polysilicon films using atomic force microscope, secondary ion mass spectroscopy and probe.
利用原子力显微镜、二次离子质谱分析仪和探针，对多晶硅薄膜的高温退火特性进行了实验研究。
From scanning electron microscope (SEM) and (AFM) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
从扫描电子显微镜(sem)和原子力显微镜(afm)图像可以观察到，薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
From scanning electron microscope (SEM) and (AFM) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
从扫描电子显微镜(sem)和原子力显微镜(afm)图像可以观察到，薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
应用推荐