The system can be combined with a variety of atomic force microscope.
该系统可应用于多种相关原子力显微镜设备。
An image of a circuit with 17 memristors captured by an atomic force microscope.
原子力显微镜拍摄的17个忆阻器构成电路的图像。
And the surface texture data by atomic force microscope (AFM) are obtained.
用原子力显微镜作为测量工具，获取表面形貌数据。
A measuring system of film thickness based on atomic force microscope has been developed.
研制了一种基于原子力显微镜的薄膜厚度检测系统。
AIM: to investigate the application of atomic force microscope (AFM) in clinic diagnosis.
目的：初步探讨原子力显微镜在临床病理学检验中的应用前景。
Methods T he cultured U251 glioma cell line was detected with atomic force microscope(AFM) .
方法应用原子力显微镜，对U251胶质瘤细胞系进行观测。
A novel atomic force microscope (AFM) for large samples to be measured in liquid is developed.
研制了一种适用于大样品的新型液相原子力显微镜。
The atomic force microscope can detail the shapes of particles as small as about 100 nanometers.
这种原子力显微镜能够扫描象100纳米一样小的颗粒的形状。
To observe linear DNA with atomic force microscope (AFM) and investigate the imaging conditions.
用原子力显微镜(afm)观察线性DNA并探讨其成像条件。
All these data indicated that atomic force microscope is a visual tool to study the cytoskeleton.
原子力显微镜是研究细胞骨架的一种可视化的工具。
Atomic force microscope (AFM) is one of the newest imaging techniques in the field of biomedicine.
原子力显微镜(afm)是目前最新的生物成像技术之一。
Atomic force microscope was used to observe the surface topography with different ssDNA concentration.
利用原子力显微镜观察不同浓度的DNA吸附在金膜上的表面形貌。
Atomic force microscope molecular imaging and nanometer manipulation will be widely applied on biomedicine.
原子力显微镜分子成像和纳米操纵技术在生物医学中具有广阔的应用前景。
Optical lever method is a main technique to detect the cantilever's position in atomic force microscope (AFM).
光杠杆法是原子力显微镜(afm)悬臂定位的主要方法。
Atomic force microscope (AFM) is a powerful tool in DNA research, in has its unique superiority in DNA research.
原子力显微镜(afm)是研究DNA有力工具，在对DNA研究中有其独特优势。
Designed an automatic control system of 42m-1.8d motor, which can be widely used in the atomic force microscope.
设计出一套能微纳米运动的42M- 1.8D电机自动控制系统，可广泛应用于大部分原子力显微镜。
Changes in surface roughness after gas cluster ion bombardments have been measured by an atomic force microscope.
用原子力显微镜测量了气体离化团束照射后表面粗糙度的变化。
Working at tapping mode, atomic force microscope(AFM) piezoelectric microcantilever vibrates with large amplitude.
在轻敲工作模式下，原子力显微镜（AFM）压电微悬臂以较大的振幅振动。
Force curve measured by Atomic force Microscope needs to be converted into force-displacement curve for application.
原子力显微镜测定的力曲线需转化为力位移曲线来应用。
With the emersion of atomic force microscope, the study of single macromolecular chain at interfaces becomes possible.
随着原子力显微镜的诞生，使高分子单链的界面研究成为可能。
A novel large-stage atomic force microscope (AFM) for nondestructive characterization of optical thin films is built.
研制了一种用于大面积光学薄膜表面无损表征的新型原子力显微镜(afm)。
This paper briefs the principle and some advance of scanning tunneling microscope (STM) and atomic force microscope (AFM).
介绍了扫描隧道显微镜(STM)和原子力显微镜(afm)的原理和目前情况。
Dynamic electric force microscopy was set up on a commercial atomic force microscope (AFM) to study the polarization of single nanocrystal.
在现有的商用原子力显微镜上实现了用动态电场力显微术来研究单个纳米颗粒的极化特性。
The theory and method of bending test on silicon nanobeam for the thickness measurement based on atomic force microscope (AFM) are introduced.
阐述了基于原子力显微镜(afm)的弯曲测试测量纳米梁杨氏模量的理论和方法。
The theory and method of bending test on nanobeam for the measurement of Young's modulus based on atomic force microscope (AFM) are introduced.
阐述了基于原子力显微镜(afm)的弯曲测试测量纳米梁杨氏模量的理论和方法。
The thermoplastic polyurethane (TPU) is prepared with mixer by one-step, and it's micro-phase separation is studied by atomic force microscope (AFM).
用一步法在密炼机中合成了热塑性聚氨酯（TPU）。在原子力显微镜（ AFM）下观察其微相分离情况。
The tungsten oxide films by two methods were characterized by atomic force microscope, double-beam UV-VIS-NIR spectrophotometer and X-diffractometer.
本文分别用原子力显微镜、双束紫外可见分光光度计、X-衍射仪等表征了用以上两种方法制备的三氧化钨薄膜。
The usage of AFM(atomic force microscope), which is a new method of surface test, in studying the fine structure of natural pig collagen was discussed.
简要介绍了原子力显微镜这一新型表面测试技术在猪皮胶原精细结构研究中的应用方法。
This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.
文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。
The characters of surface morphology of pure aluminum matrix composites were observed by atomic force microscope (AFM) during the early stages of corrosion.
利用原子力显微镜观察了纯铝基复合材料早期腐蚀过程中表面形貌的变化特征。
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