The molecular morphology was observed directly by atom force microscope (AFM) and transmission electron microscope (TEM).
采用原子力显微镜及透射电镜直接观测分子形貌。
Smooth surface morphology of the films was observed by atom force microscope(AFM).
采用原子力显微镜（AFM）观察了薄膜的表面形貌，结果显示其表面较为平整。
With the help of the atom force microscope (AFM), we observed the junction surfaces and found that there exists semisphere-formed roughness in regular arrangement on the surface.
利用原子力显微镜(afm)观察MIM隧道结的表面形貌，发现结表面存在规则有序的自然粗糙度。
Scanning electron microscope (SEM) and atom force microscope (AFM) were used to characterize the morphologies of the AAO template, respectively.
并采用扫描电子显微镜（SEM）及原子力显微镜（AFM）对AAO模板表面及内部结构进行了表征。
Scanning electron microscope (SEM) and atom force microscope (AFM) were used to characterize the morphologies of the AAO template, respectively.
并采用扫描电子显微镜（SEM）及原子力显微镜（AFM）对AAO模板表面及内部结构进行了表征。
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