The samples were characterized by the X-ray and Atom Force Microscope.
用X射线和原子力显微镜对其进行了表征。
Smooth surface morphology of the films was observed by atom force microscope(AFM).
采用原子力显微镜（AFM）观察了薄膜的表面形貌，结果显示其表面较为平整。
The molecular morphology was observed directly by atom force microscope (AFM) and transmission electron microscope (TEM).
采用原子力显微镜及透射电镜直接观测分子形貌。
Scanning electron microscope (SEM) and atom force microscope (AFM) were used to characterize the morphologies of the AAO template, respectively.
并采用扫描电子显微镜（SEM）及原子力显微镜（AFM）对AAO模板表面及内部结构进行了表征。
With the help of the atom force microscope (AFM), we observed the junction surfaces and found that there exists semisphere-formed roughness in regular arrangement on the surface.
利用原子力显微镜(afm)观察MIM隧道结的表面形貌，发现结表面存在规则有序的自然粗糙度。
Raman spectrometer and atom force microscope were employed to study and determine the structure and characteristics of the films prepared by the method of magnetron sputtering with graphite target.
用激光拉曼谱和原子力显微镜等现代分析手段研究了磁控溅射石墨靶制备的薄膜的结构和特性。
Raman spectrometer and atom force microscope were employed to study and determine the structure and characteristics of the films prepared by the method of magnetron sputtering with graphite target.
用激光拉曼谱和原子力显微镜等现代分析手段研究了磁控溅射石墨靶制备的薄膜的结构和特性。
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