A new method of monitoring the in-situ extremely low residual reflectivity of antireflection (AR) coating of travelling-wave semiconductor laser amplifier (TW-SLA) is presented.
介绍一种实时监控行波半导体激光放大器(TW - SLA)抗反膜(AR)超低剩余反射率的新方法。
A new method of monitoring the in-situ extremely low residual reflectivity of antireflection (AR) coating of travelling-wave semiconductor laser amplifier (TW-SLA) is presented.
介绍一种实时监控行波半导体激光放大器(TW - SLA)抗反膜(AR)超低剩余反射率的新方法。
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