The problems of laser diode life test are introduced, and the integrating cavity scanning (ICS) method is given in laser diodes (LD) high-temperature accelerating life test.
介绍了半导体激光二极管（LD）寿命测试中存在的问题，并据此给出了LD高温加速寿命测试的积分球扫描法。
The problems of laser diode life test are introduced, and the integrating cavity scanning (ICS) method is given in laser diodes (LD) high-temperature accelerating life test.
介绍了半导体激光二极管（LD）寿命测试中存在的问题，并据此给出了LD高温加速寿命测试的积分球扫描法。
应用推荐