Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic device's activation energy is proposed, and the theory model is constructed.
通过对序进应力加速寿命试验的研究，提出了一种快速评价微电子器件失效激活能的方法，建立了计算失效激活能的理论模型。
Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic devices activation energy is proposed, and the theory model is constructed.
通过对序进应力加速寿命试验的研究，提出了一种快速评价半导体器件失效激活能的方法，建立了计算失效激活能的理论模型。
Study on stability of Caitong Tablets with the constant temperature accelerated test has been carried out.
本文采用恒温加速试验法对柴酮片的稳定性进行研究。
Two main methods, accelerated lifetime test and drift velocity test, to study electromigration are described.
介绍了研究集成电路互连线电迁移的两种方法：加速寿命试验和移动速度试验。
Two main methods, accelerated lifetime test and drift velocity test, to study electromigration are described.
介绍了研究集成电路互连线电迁移的两种方法：加速寿命试验和移动速度试验。
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