Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic device's activation energy is proposed, and the theory model is constructed.
通过对序进应力加速寿命试验的研究，提出了一种快速评价微电子器件失效激活能的方法，建立了计算失效激活能的理论模型。
Basing on the study of progressive stress accelerated life test, a rapid evaluation method for electronic devices activation energy is proposed, and the theory model is constructed.
通过对序进应力加速寿命试验的研究，提出了一种快速评价半导体器件失效激活能的方法，建立了计算失效激活能的理论模型。
Besides, storage reliability evaluation technology such as field storage, long-term storage test, limit stress test and accelerated storage life test are compared in utility.
并从应用性角度出发，对现场贮存、长期自然贮存试验、极限应力、加速贮存寿命试验等贮存可靠性评价技术进行了对比分析。
Confidence interval of the coefficient of acceleration is derived based on step-stress accelerated life test data.
在定数截尾和定时截尾步加试验情形，导出了加速系数的置信区间。
Based on the expounding of the prediction theory for storage life of electromagnetic relays, the constant stress accelerated life test was introduced.
在阐述电磁继电器贮存寿命预测理论的基础上，选择了采用恒定应力加速寿命试验方法对电磁继电器进行试验及寿命预测。
Based on the expounding of the prediction theory for storage life of electromagnetic relays, the constant stress accelerated life test was introduced.
在阐述电磁继电器贮存寿命预测理论的基础上，选择了采用恒定应力加速寿命试验方法对电磁继电器进行试验及寿命预测。
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