The sample test results from this synthetic test circuit are comparable with that acquired previously from a conventional Back-to-Back direct test circuit.
从合成试验回路所获得的样品试验结果和以前从传统的背靠背试验回路获得试验结果是相同的。
The sample test results from this synthetic test circuit are comparable with that acquired previously from a conventional Back-to-Back direct test circuit.
从合成试验回路所获得的样品试验结果和以前从传统的背靠背试验回路获得试验结果是相同的。
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