• 利用光学显微镜(OM)扫描电镜(SEM)对麦秆横切面、外表面的组织结构进行观察和分析。

    By using Optical Microscope (OM) and Scanning Electron Microscope (SEM), the structural features of cross section, interior and exterior surfaces for wheat straws were observed and analyzed.

    youdao

  • 利用光学显微镜(OM)扫描电镜(SEM)对麦秆横切面、外表面的组织结构进行观察和分析。

    By using Optical Microscope (OM) and Scanning Electron Microscope (SEM), the structural features of cross section, interior and exterior surfaces for wheat straws were observed and analyzed.

    youdao

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