为进一步降低测试功耗及测试应用时间，提出一种基于扫描链阻塞技术且针对非相容测试向量的压缩方法。
For the test application time can be reduced effectively, this paper proposes an approach based on scan chain disabling technique, in view of incompatible test vector compression method.
我们改进了各向异性插值误差估计的判定方法，并给出非协调元的相容误差的各向异性误差估计的方法。
We have improved the method of anisotropic interpolation error estimations and presented a method to estimate the consistent errors of nonconforming elements.
我们改进了各向异性插值误差估计的判定方法，并给出非协调元的相容误差的各向异性误差估计的方法。
We have improved the method of anisotropic interpolation error estimations and presented a method to estimate the consistent errors of nonconforming elements.
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