通过对张力测试的分析及传感器的原理分析，介绍一种应用于测试微电子集成电路丝线张力的小量程张力测试机构的设计。
This paper introduces a design of machine in small range tension test which is applied to a field of micro-electronics integrate circuit, by analyzing tasting method and sensor theory.
为了降低开发超大规模集成电路器件的测试程序的费用，缩短开发周期，给出了一种设计和开发测试系统仿真器的基本思想、结构组成及其功能。
In order to reduce the cost of developing VLSI test program and shorten developing cycle, an idea of a simulator design of test system and gives the simulators structure and function is put up.
本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。
This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).
集成电路工艺的改进使存储器的测试面临着更大的挑战。
Test of memory faces enormous challenge because of the semiconductor technology progress.
本文设计的微气压传感器的制作工艺与集成电路工艺兼容，结构上主要包括加热电阻、敏感元件和测试电阻等三部分。
The micro gas pressure sensor designed in this thesis can be fabricated using an IC compatible process, and it is composed of a heating resistor, a sensitive element and a testing resistor.
最后将错位相移器应用于集成电路硅片薄膜应力分布测试仪及错位电子散斑干涉仪之中。
This technic has been used in the instrument of IC wafer Stress Analyzer and Shear Electronic Speckle Pattern Interferometry (SESPI).
该扫描路径上的延迟减少对外部缓冲器的需求，进而在集成电路扫描测试时避免保持时间违反。
The delay in the scan path reduces the need for external buffers to avoid hold-time violations during scan testing of integrated circuits.
该扫描路径上的延迟减少对外部缓冲器的需求，进而在集成电路扫描测试时避免保持时间违反。
The delay in the scan path reduces the need for external buffers to avoid hold-time violations during scan testing of integrated circuits.
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