本文介绍了透射式电子显微镜（TEM）用的横截面样品的制作技术。
The technique for preparing cross-sectional specimen of semiconductor for TEM is shown.
在本文中作者描述了工作在300～700兆赫的透射式扫描声学显微镜的研究试制工作。
The research and development of a transmission scanning acoustic microscope operating at 300-700MHz is described.
在本文中作者描述了工作在300～700兆赫的透射式扫描声学显微镜的研究试制工作。
The research and development of a transmission scanning acoustic microscope operating at 300-700MHz is described.
应用推荐