• 作为VLS I线金属薄膜面积越来越其承受功率密度急剧增加,使得迁移成为电路主要失效模式之一

    Consequently, the metal interconnects of VLSI have smaller sectional area and carry increasing power density, which made the electromigration become one of the main latent damage modes.

    youdao

  • 改善配对模式玩家频繁地被配对至互相连线良好的其他玩家。

    Improvements to matchmaking so players that have good connections to each other are matched together more frequently.

    youdao

  • 改善配对模式玩家频繁地被配对至互相连线良好的其他玩家。

    Improvements to matchmaking so players that have good connections to each other are matched together more frequently.

    youdao

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