主控器设计是边界扫描测试系统设计的重点。
The design of a BSM is the key problem of the implementation of the Boundary Scanning Test System implementation.
本文还讨论了两种智能故障诊断技术，即专家系统智能故障诊断技术和边界扫描测试智能故障诊断技术。
The paper also discusses two intelligent fault diagnostic methods: expert system intelligent fault diagnostic method and boundary-scan technique intelligent fault diagnostic method.
JTAG边界扫描机制是用于在线导通测试的新技术，利用JTAG可以在数分钟内查出复杂插件和系统的全部导通故障。
JTAG Boundary Scan is a new technique for connection test. With the help of JTAG, we can find out all connection faults of a complicated board or system.
系统级可测性设计主要是将存储器BIST与ARM核的边界扫描测试相结合。
SRAM BIST is also combined with ARM core's boundary scan testing during system level DFT.
该文在研究边界扫描体系结构和TAP接口控制器的基础上，在一个测试系统中，实现了基于JTAG规范的主ta P接口设计。
On the basis of research on the bound ary-scan architecture and TAP controller, the paper implements a design for a t ap interface based on JTAG specification in a test system.
在某计算机系统中设计了基于JTAG边界扫描计算机插件或系统在线导通测试系统，这是一个新颖通用的系统。
We have developed a new On-line Connecting Test System based on JTAG boundary scan for computer plug-unit or system.
文中介绍JTAG边界扫描的概念、技术特点，以及在芯片功能测试、系统诊断、仿真、性能分析和导通测试方面的应用。
This paper focuses on the JTAG ideas and technical characteristics and summarizes the JTAG usage in chip function test, system diagnosis, simulation, performance analysis and conduction test.
本文提出将测试领域成熟的边界扫描技术应用在实验系统中，解决配置和验证两大关键问题。
The paper proposes applying boundary-scan technology which is widely used in the domain of test to the computer hardware experiment to resolve the two crucial problems of configuration and test.
硬件系统的规模越来越大，复杂程度越来越高，对其进行测试也越来越困难，边界扫描技术很好地解决了传统测试的不足。
As the scale and complexity of hardware systems increase quickly, it is now a more difficult task to test them. The BST technique can well make up the shortcoming of traditional test techniques.
与此同时，片上系统的测试问题也随之产生，基于边界扫描的内建自测试技术为片上系统的测试提供了新的解决方案。
Meanwhile the testing of SOC become more difficult and complex, Boundary-Scan-based Built-in-Test technology give a new solution.
与此同时，片上系统的测试问题也随之产生，基于边界扫描的内建自测试技术为片上系统的测试提供了新的解决方案。
Meanwhile the testing of SOC become more difficult and complex, Boundary-Scan-based Built-in-Test technology give a new solution.
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