所有专业功能测试员都会关注他们擅长处理的问题领域，如边界测试、压力测试和公共路径测试。
All professional function testers have their favorite problem areas on which they concentrate, such as bounds testing, stress testing, and common path testing.
通过这种方式，可以测试组件的所有功能、声明有效的行为、检验边界条件并确保适当地将组件降级。
This way, all the functionality of the component can be exercised, valid behavior asserted, boundary conditions explored, and graceful degrading ensured.
如果单元测试跨越类边界，则它就可能是功能测试。
If a unit test crosses class boundaries, it might be a functional test.
介绍了数据采集的原理和ASIC的基本功能、实现以及JTAG的边界扫描测试技术。
In this paper, the principle of data collection, the basic function and implementation of asic and the technology of JTAG BST are presented.
边界值测试是一种常用的功能测试方法。
Boundary value test is a functional test approach in common use.
本文的最后还设计了一些测试用例对整个过程功能进行测试，主要是对功能的一些边界测试。
Finally, this paper designed a number of functional test cases to test the entire function; the main work is to test some boundaries of the function.
边界扫描技术与功能测试的结合，可以扩展边界扫描技术的应用范围，实现了更高的测试覆盖率。
Combining boundary scan with functional test, expanded application of boundary scan and larger testing coverage may be realized.
文中介绍JTAG边界扫描的概念、技术特点，以及在芯片功能测试、系统诊断、仿真、性能分析和导通测试方面的应用。
This paper focuses on the JTAG ideas and technical characteristics and summarizes the JTAG usage in chip function test, system diagnosis, simulation, performance analysis and conduction test.
该电路可实现测试、编程功能，并符合IEEE1149.1边界扫描标准的规定，测试结果达到设计要求。
Test results show that the FPGA chip can realize the desired functions of test and programming in accordance with IEEE1149.1 boundary scan standard, and meets the requirement of the design.
该电路可实现测试、编程功能，并符合IEEE1149.1边界扫描标准的规定，测试结果达到设计要求。
Test results show that the FPGA chip can realize the desired functions of test and programming in accordance with IEEE1149.1 boundary scan standard, and meets the requirement of the design.
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