本文提出了产生数字电路测试码的一种算法——主路径敏化法。

This paper presents an algorithm of test patterns generation for digital circuits which is called the principal path sensitization method.

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首先，文章讨论了静态时序分析中的伪路径问题以及路径敏化算法，分析了影响逻辑门和互连线延时的因素。

Firstly, false paths in static timing analysis and the algorithm to sensitize paths are presented, and then some factors affecting gates and interconnects delay are discussed.

youdao

首先，文章讨论了静态时序分析中的伪路径问题以及路径敏化算法，分析了影响逻辑门和互连线延时的因素。

Firstly, false paths in static timing analysis and the algorithm to sensitize paths are presented, and then some factors affecting gates and interconnects delay are discussed.

youdao