并用FT-IR、XRD、DTA/TG和TEM等手段研究了二氧化硅超微细粉在煅烧过程中的物相和显微结构的变化。
Phase and microstructure changes of silica ultrafine particles in sintering were studied with FT-IR, XRD, DTA/TG and TEM et al.
并用FT-IR、XRD、DTA/TG和TEM等手段研究了二氧化硅超微细粉在煅烧过程中的物相和显微结构的变化。
Phase and microstructure changes of silica ultrafine particles in sintering were studied with FT-IR, XRD, DTA/TG and TEM et al.
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